Electro-Thermo-Mechanical Finite Element Modeling to Investigate the Reliability of Automotive MOSFET Transistor
نویسندگان
چکیده
Even under normal operating conditions, power devices are subject to temperature changes that generate high level of stress repeatedly causes mechanical breakdown. In this context thermomechanical simulations are necessary to predict life time and guarantee a longer lifespan. This paper aims to modeling electro-thermo-mechanical behavior of a vertical power transistor for predicting the influence of various geometric parameters such as the thickness of the metallization source on the electrical, thermal and mechanical behavior, and the reliability of the component.
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